Keyphrases
Cadmium Telluride
83%
Radiation Hardness
64%
Silicon Detectors
50%
Semiconductors
50%
Ga2O3
36%
High Resistivity
34%
Activation Energy
34%
Metal-organic Chemical Vapor Deposition (MOCVD)
32%
Ohmic Contact
31%
CdZnTe Spectrometer
30%
P-type
30%
Charge Collection Efficiency
30%
Oxygen Enrichment
29%
Silicon-germanium
28%
Electron Injection
28%
Irradiation
27%
Spectrometer
24%
Diffusion Length
24%
Schottky Contact
23%
Resistivity
22%
Minority Carrier Transport
22%
Atomic Force Microscopy
22%
Single Crystal
21%
Electrical Properties
20%
Mobility-lifetime Product
19%
CdZnTe Crystal
19%
Gallium Oxide
19%
Electric Field (E-field)
19%
Radiation Tolerance
18%
Epitaxial
18%
Cathodoluminescence
18%
Large Hadron Collider
17%
Enriched Silicon
17%
Surface Treatment
17%
Current-voltage
17%
Proton
17%
Photon-assisted
16%
Floating Zone
16%
Semiconductor Detector
16%
RD50
16%
Bridgman
16%
Dark Noise
15%
Metal-semiconductor-metal
15%
Annealing
15%
Oxygen Concentration
15%
Si-doped
14%
High-resistivity Silicon (HR-Si)
14%
Wafer
14%
X-ray Detectors
14%
Interface Charge
14%
Material Science
Silicon
100%
Electrical Resistivity
86%
Surface (Surface Science)
72%
Activation Energy
50%
Oxide Compound
33%
Chemical Vapor Deposition
30%
Cathodoluminescence
29%
Germanium
28%
Carrier Transport
28%
Finite Element Method
27%
Density
24%
Gallium
22%
Indium
20%
Single Crystal
19%
Schottky Barrier
19%
Hole Mobility
18%
Atomic Force Microscopy
17%
Silicon Wafer
16%
Current Voltage Characteristics
14%
Proton Irradiation
14%
Cadmium
12%
Scanning Probe Microscopy
12%
Capacitance
11%
Current-Voltage Characteristic
11%
Diamond
11%
Silver
11%
Nitride Compound
11%
Carrier Concentration
11%
Atomic Structure
11%
Lithium
11%
Epilayers
11%
Silicon Memory
11%
Hot Electron
11%
Surface Treatment
11%
Scanning Electron Microscopy
10%
Scanning Tunneling Microscopy
9%
Silicon Device
8%
Film
8%
Manganese
8%
Wide Bandgap Semiconductor
8%
Carrier Lifetime
8%
Annealing
8%
Schottky Diode
7%
Polishing
7%
Aluminum
7%
Semiconductor Device
6%
Thin Films
5%
Magnetron Sputtering
5%
Aluminum Oxide
5%
Optical Property
5%
Engineering
Collection Efficiency
35%
Chemical Vapor Deposition
33%
Radiation Detector
31%
Atomic Force Microscopy
27%
Activation Energy
26%
Vapor Deposition
22%
Passivation
21%
Electric Field
20%
Polycrystalline
18%
Experimental Result
17%
Scanning Probe Microscopy
16%
Resistive
14%
Surface Potential
14%
Scanning Tunneling Microscopy
14%
Silicon Wafer
14%
Nanoscale
13%
Room Temperature
13%
Tunnel Construction
13%
Potential Difference
12%
Current-Voltage Characteristic
12%
Bias Voltage
11%
Diamond
11%
Oxygen Concentration
11%
Metal Organic Chemical Vapor Deposition
11%
Induced Polarization
11%
Band Gap
11%
Solar Cell
11%
Mathematical Model
11%
Engineering
11%
Gamma Ray
11%
Temperature Range
10%
Kinetic Model
10%
Fits and Tolerances
10%
Transients
9%
Alpha Particle
9%
Nonequilibrium
9%
Recombination Centre
8%
Semiconductor Device
8%
Metallizations
8%
Deep Level
8%
Temperature Dependence
8%
Radiation Effect
8%
Shot Noise
8%
Photon Energy
7%
Gas-Phase
7%
Pyrolysis
7%
Polarization Effect
7%
Heat Treatment
7%
Power Spectral Density
7%
Scanning Electron Microscope
7%