X-ray Diffraction (XRD)

The XRD diffraction laboratory in the Wolfson Applied Material Research Center is characterized by versality of instrumentation. The Bruker D8 Discover diffractometer is equipped with the linear energy discriminate detector LINXEYE XE. The larger diffraction circle gives a better angular resolution, the intensity losing, due the longer beam path, is compensate by the energy discriminate detector.



This device minimizes the fluorescence and Kb radiation, without losing intensity, so other monochromatizating devices are not relevant.



Two other important features:

fast optic changer, so it is possible pass from standard divergent beam to parallel beam, using the Göbels mirror. This setup is used to study surfaces as well for transmission diffraction (membrane and capillary). Moreover, by using parallel beam, it is possible to collect excellent data on irregular samples, as rocks or manufacts, as well to analyze small portions (0.3 to 1 mm) of the sample.
Versatility of Eulerian Cradle at the center of the goniometer: together with the standard plastic and zero background sample holders, the wide space between the diffractometer arms allows to study relatively big rocks or manufacts.
There is a wide spectrum of crystalline materials that can been analyzed in this laboratory: from organic/bioorganic molecules to inorganic and mineralogical samples.



Several analyses can be executed:

Qualitative and quantitative analysis are accomplished to reveal the phases present in the samples and determine their weight fractions.
Determine the grain size, the cell parameters and the crystal structure.
The XRD parallel beam set-up can be used to study the surface properties of crystalline deposition on crystalline substrate.


Specs:

Longer Goniometer diameter (430 mm)
Higher resolution
Goniometer scan: θ/θ and 2θ
Higher versability (transmission/reflection diffraction)
Detector: LYNXEYE XE linear detector
Fast and sensible detector
Monochromatizating: energy discriminate detector
Fluorescence and spurious radiation (Kb and KW)
Radiation: Copper or Chromium
Different optics set up:
Divergent beam
Parallel beam
Circular parallel beam
Divergent beam: Bragg-Brentano set-up
Standard set-up
Low background/high intensity
Max resolution
Parallel beam setup
Grazing incidence
Rough surface diffraction
Transmission mode capillary/membrane
Micro beam (oval shape, 0.3-1mm)
Circular parallel beam
Micro beam (circular)
Sample holder
x– y– z-centering (Eulerian cradle)
Zero background sample holder
High quantity sample holder
Airtight sample holder
Wafer chuck
Membrane transition holder
Rotating Capillary holder


XRPD application:

Phase identification
PDF4+/organics database
Phase quantity analysis
Rietveld method
Amorphous phase quantification (Standard method)
Structural resolution and analysis
Cell parameter determination
Structure resolution
Structure parameter refinement
Profile analysis
Grain size analysis


Location:

Multidisciplinary Research Building, Room #101.