Characterization

    Center for Nanoscience and Nanotechnology

    Equipment/facility: Facility

      Equipments Details

      Contact Information

      Web addressesWebsite

      Equipment hierarchy

      Characterization
      AFM
      Confocal Microscope Olympus LEXT 4000
      Contact Angle
      DLS
      Ellipsometer Woolam
      Environmental Scanning Electron Microscope (ESEM)
      FTIR Spectrophotometer
      Helios 5 UC Dual Beam FIB and HR-SEM
      HRSEM ZEISS Gemini 300
      I-V/C-V meter Keithley 4210
      LAMBDA™ 1050 - UV/Vis/NIR Spectrophotometer
      NanoDrop
      Profilometer DEKTAK
      Profilometer KLA
      Raman Spectroscopy
      TEM Talos F200i
      Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS)
      X-ray Diffraction (XRD)
      X-ray Photoelectron Spectrometer Microprobe (XPS)