Equipments Details
Description
Manufacturer and model:
AFM Nanowizard 3 from JPK.
Description:
Surface mapping with atomic resolution of surface roughness, mechanical material constants (such as Young modulus, elasticity, etc.), electrical material parameters (such as surface potential, electron affinity, work function, etc.) The capability to couple the AFM cantilever engine with the Raman spectroscopy probe adds the possibility of precise surface mapping of chemical content in investigated samples.
Specification:
Atomic force microscope capable of working in a tapping as well as contact modes.
Force curves are possible to acquire for the evaluation of the elastic properties of the sample.
The machine is coupled to an inverted light microscope (transmission type) so for the predefined site measurements the sample must be transparent.
Location:
Nano center building, Room #26.
AFM Nanowizard 3 from JPK.
Description:
Surface mapping with atomic resolution of surface roughness, mechanical material constants (such as Young modulus, elasticity, etc.), electrical material parameters (such as surface potential, electron affinity, work function, etc.) The capability to couple the AFM cantilever engine with the Raman spectroscopy probe adds the possibility of precise surface mapping of chemical content in investigated samples.
Specification:
Atomic force microscope capable of working in a tapping as well as contact modes.
Force curves are possible to acquire for the evaluation of the elastic properties of the sample.
The machine is coupled to an inverted light microscope (transmission type) so for the predefined site measurements the sample must be transparent.
Location:
Nano center building, Room #26.
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